Publication:
A Bypassable Scan Flip-Flop for Low Power Testing With Data Retention Capability
Loading...
Journal
Abstract
Description
Statistics
Downloads
853 since deposited on 2022-03-09
46last month
Acq. date: 2026-05-31
Views
1911 since deposited on 2022-03-09
Acq. date: 2026-05-31
Citations
Statistics
Downloads
853 since deposited on 2022-03-09
46last month
Acq. date: 2026-05-31
Views
1911 since deposited on 2022-03-09
Acq. date: 2026-05-31
Citations