Publication:
Characterization of the Vt-instability un SiO2 HFO2 gate dielectrics
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1950 since deposited on 2021-10-15
5last month
Acq. date: 2026-08-19
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Statistics
Views
1950 since deposited on 2021-10-15
5last month
Acq. date: 2026-08-19
Citations