Publication:
Gate-dielectric interface effects in low frequency (1/f) noise in p-MOSFETs with high-K dielectrics
Date
Loading...
Journal
Abstract
Description
Statistics
Views
1959 since deposited on 2021-10-16
1last month
Acq. date: 2026-05-29
Citations
Statistics
Views
1959 since deposited on 2021-10-16
1last month
Acq. date: 2026-05-29
Citations