Publication:

Impact of charge trapping on imprint and its recovery in HfO2 based FeFET

Date

2019
Proceedings Paper
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

42830.pdf 2.03 MB

Author(s)

Higashi, Yusuke  
;
Ronchi, Nicolo  
;
Kaczer, Ben  
;
Banerjee, Kaustuv  
;
McMitchell, Sean  
;
O'Sullivan, Barry  
;
Clima, Sergiu  
;
Minj, Albert  
;
Celano, Umberto  
;
Di Piazza, Luca  
;
Suzuki, Masamichi  
;
Linten, Dimitri  
;
Van Houdt, Jan  

Journal

Abstract

Description

Statistics

Views

2063 since deposited on 2021-10-27
1last month
Acq. date: 2026-06-05

Citations

Statistics

Views

2063 since deposited on 2021-10-27
1last month
Acq. date: 2026-06-05

Citations