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Optimizing EUV Imaging Metrics as a Function of Absorber Thickness and Illumination Source: Simulation Case Study of Ta-Co alloys
Publication:
Optimizing EUV Imaging Metrics as a Function of Absorber Thickness and Illumination Source: Simulation Case Study of Ta-Co alloys
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Date
2022
Proceedings Paper
https://doi.org/10.1117/12.2640098
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Philipsen, Vicky
;
Thakare, Devesh
;
Delabie, Annelies
Journal
Proceedings of SPIE
Abstract
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Statistics
Downloads
863
since deposited on 2022-12-11
53
last month
Acq. date: 2026-06-04
Views
1221
since deposited on 2022-12-11
1
last month
Acq. date: 2026-06-04
Citations