Publication:

Understanding the Leakage Mechanisms and Breakdown Limits of Vertical GaN-on-Si p(+)n(-)n Diodes: The Road to Reliable Vertical MOSFETs

Date

2021
Journal article
https://doi.org/10.3390/mi12040445
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Author(s)

Mukherjee, Kalparupa
;
De Santi, Carlo
;
Buffolo, Matteo
;
Borga, Matteo  
;
You, Shuzhen  
;
Geens, Karen  
;
Meneghini, Matteo
;
Bakeroot, Benoit  
;
Decoutere, Stefaan  
;
Gerosa, Andrea
;
Meneghesso, Gaudenzio
;
Zanoni, Enrico

Journal

MICROMACHINES

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676 since deposited on 2022-02-18
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