Publication:
X-ray and ToF-SIMS comparison of resistive switching NiO films obtained from controlled Ni thermal oxidation, e-beam and ALD
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2075 since deposited on 2021-10-17
1last month
Acq. date: 2026-05-29
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Statistics
Views
2075 since deposited on 2021-10-17
1last month
Acq. date: 2026-05-29
Citations