Publication:

Effects of negative-bias-temperature-instability on low-frequency noise in SiGe p MOSFETs

Date

2016
Journal article
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Author(s)

Duan, Guo Xing
;
Hachtel, Jordan
;
Zhang, En Xia
;
Zhang, Cher Xuan
;
Fleetwood, Daniel
;
Schrimpf, Ronald
;
Reed, Robert
;
Mitard, Jerome  
;
Linten, Dimitri  
;
Witters, Liesbeth  
;
Collaert, Nadine  
;
Mocuta, Anda
;
Chisholm, Matthew
;
Pantelides, Sokrates

Journal

IEEE Transactions on Device and Materials Reliability

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