Publication:
Investigation of correlated trap sites in SILC, BTI and RTN in SiON and HKMG devices
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1854 since deposited on 2021-10-22
2last month
Acq. date: 2026-08-15
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Statistics
Views
1854 since deposited on 2021-10-22
2last month
Acq. date: 2026-08-15
Citations