Publication:
Negative bias temperature instabilities in SiGe-pMOSFETs with SiO2/HfO2 gate dielectrics
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1962 since deposited on 2021-10-21
1last month
Acq. date: 2026-05-28
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Statistics
Views
1962 since deposited on 2021-10-21
1last month
Acq. date: 2026-05-28
Citations