Publication:
Two-dimensional carrier profiling with sub-nm resolution using SSRM: from basic concept to TCAD calibration and device tuning
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1973 since deposited on 2021-10-17
7last month
1last week
Acq. date: 2026-08-17
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Statistics
Views
1973 since deposited on 2021-10-17
7last month
1last week
Acq. date: 2026-08-17
Citations