Publication:
Charge trapping, mobility degradation and reliability of high-e gate stacks
Date
Loading...
Journal
Abstract
Description
Statistics
Views
1952 since deposited on 2021-10-14
2last month
Acq. date: 2026-05-31
Citations
Statistics
Views
1952 since deposited on 2021-10-14
2last month
Acq. date: 2026-05-31
Citations