Publication:

Assessment of Ge1-xSnx alloys for strained Ge CMOS devices

Date

2010
Meeting abstract
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Author(s)

Takeuchi, S.
;
Shimura, Y.
;
Nishimura, T.
;
Vincent, Benjamin  
;
Eneman, Geert  
;
Clarysse, Trudo
;
Demeulemeester, J.
;
Temst, K.
;
Vantomme, Andre  
;
Dekoster, Johan  
;
Caymax, Matty  
;
Loo, Roger  
;
Nakatsuka, O.
;
Sakai, A.
;
Zaima, S.

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