Publication:

Compact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range

Date

2023
Journal article
https://doi.org/10.3390/mi14112018
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Published version 8.58 MB

Author(s)

Tyaginov, Stanislav  
;
Bury, Erik  
;
Grill, Alexander  
;
Yu, Zhuoqing
;
Makarov, Alexander  
;
De Keersgieter, An  
;
Vexler, Mikhail
;
Vandemaele, Michiel  
;
Wang, Runsheng
;
Spessot, Alessio  
;
Vaisman Chasin, Adrian  
;
Kaczer, Ben  

Journal

MICROMACHINES

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170 since deposited on 2023-12-31
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944 since deposited on 2023-12-31
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