Compact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range

Tyaginov, Stanislav; Bury, Erik; Grill, Alexander; Yu, Zhuoqing; Makarov, Alexander; De Keersgieter, An; Vexler, Mikhail; Vandemaele, Michiel; Wang, Runsheng; Spessot, Alessio; Vaisman Chasin, Adrian; Kaczer, Ben

doi:10.3390/mi14112018

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Compact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range

Date

2023

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https://doi.org/10.3390/mi14112018

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Vaisman Chasin, Adrian

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Kaczer, Ben

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MICROMACHINES

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126 since deposited on 2023-12-31

Acq. date: 2026-06-02

943 since deposited on 2023-12-31

Acq. date: 2026-06-02

Compact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range

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