Publication:
I/O thick oxide device integration using Diffusion and Gate Replacement (D&GR) gate stack integration
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2122 since deposited on 2021-10-22
1last month
Acq. date: 2026-10-12
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Statistics
Views
2122 since deposited on 2021-10-22
1last month
Acq. date: 2026-10-12
Citations