Publication:
Microscopic oxide defects causing BTI, RTN, and SILC on high-K FinFETs
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1904 since deposited on 2021-10-22
1last month
1last week
Acq. date: 2026-08-18
Citations
Statistics
Views
1904 since deposited on 2021-10-22
1last month
1last week
Acq. date: 2026-08-18
Citations