Publication:

ESD HBM Discharge Model in RF GaN-on-Si (MIS)HEMTs

Date

2022
Journal article
https://doi.org/10.1109/ted.2022.3141038
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Author(s)

Wu, Wei-Min  
;
Ker, Ming-Dou
;
Chen, Shih-Hung  
;
Sibaja-Hernandez, Arturo  
;
Yadav, Sachin  
;
Peralagu, Uthayasankaran  
;
Yu, Hao  
;
Alian, AliReza  
;
Putcha, Vamsi  
;
Parvais, Bertrand  
;
Collaert, Nadine  
;
Groeseneken, Guido  

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

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