Publication:

Modeling the Operation of Charge Trap Flash Memory–Part I: The Importance of Carrier Energy Relaxation

Date

2024
Journal article
https://doi.org/10.1109/ted.2023.3339076
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

Published version 2.89 MB

Author(s)

Schanovsky, F.
;
Verreck, Devin  
;
Stanojevic, Z.
;
Schallert, S.
;
Arreghini, Antonio  
;
Van den Bosch, Geert  
;
Rosmeulen, Maarten  
;
Karner, M.

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

Abstract

Description

Statistics

Downloads

721 since deposited on 2024-01-07
165last month
43last week
Acq. date: 2026-08-17

Views

875 since deposited on 2024-01-07
1last month
Acq. date: 2026-08-17

Citations

Statistics

Downloads

721 since deposited on 2024-01-07
165last month
43last week
Acq. date: 2026-08-17

Views

875 since deposited on 2024-01-07
1last month
Acq. date: 2026-08-17

Citations