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Nondestructive, high-resolution, chemically specific 3D nanostructure characterization using phase-sensitive EUV imaging reflectometry

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Acq. date: 2026-06-03

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545 since deposited on 2021-11-02
19last month
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1682 since deposited on 2021-11-02
1last month
Acq. date: 2026-06-03

Citations