Publication:
Origin of Voids at the SiO2/SiO2 and SiCN/SiCN Bonding Interface Using Positron Annihilation Spectroscopy and Electron Spin Resonance
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1492 since deposited on 2023-03-25
263last month
64last week
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903 since deposited on 2023-03-25
7last month
Acq. date: 2026-08-20
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