Publication:
Analytical model for anomalous positive bias temperature instability in La-based HfO2 nFETs based on independent characterization of charging components
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1888 since deposited on 2021-10-21
4last month
Acq. date: 2026-10-13
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Statistics
Views
1888 since deposited on 2021-10-21
4last month
Acq. date: 2026-10-13
Citations