Publication:
Detection of Failure Mechanisms in 24-40 nm FinFETs with (spectral) photon emission techniques using InGaAs camera
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1837 since deposited on 2021-10-26
1last month
Acq. date: 2026-06-01
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Views
1837 since deposited on 2021-10-26
1last month
Acq. date: 2026-06-01
Citations