Publication:
Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs
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2275 since deposited on 2022-02-14
164last month
27last week
Acq. date: 2026-08-18
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1698 since deposited on 2022-02-14
7last month
1last week
Acq. date: 2026-08-18
Citations