Publication:

The impact of the gate dielectric quality in developing Au-free D-mode and E-mode recessed gate AlGaN/GaN transistors on a 200mm Si substrate

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1904 since deposited on 2021-10-23
4last month
Acq. date: 2026-08-18

Citations

Statistics

Views

1904 since deposited on 2021-10-23
4last month
Acq. date: 2026-08-18

Citations