Measurement of direct and indirect bandgaps in synthetic ultrathin MoS2 and WS2 films from photoconductivity spectra

Shlyakhov, Ilya; Iakoubovskii, K.; Banerjee, Sreetama; Gaur, Abhinav; Lin, Dennis; Asselberghs, Inge; Radu, Iuliana; Chai, J.; Yang, M.; Wang, S. J.; Houssa, Michel; Stesmans, A.; Afanas'ev, V.

doi:10.1063/5.0046305

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Measurement of direct and indirect bandgaps in synthetic ultrathin MoS2 and WS2 films from photoconductivity spectra

Date

2021

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https://doi.org/10.1063/5.0046305

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JOURNAL OF APPLIED PHYSICS

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1964 since deposited on 2021-11-02

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Acq. date: 2026-08-19

Measurement of direct and indirect bandgaps in synthetic ultrathin MoS2 and WS2 films from photoconductivity spectra

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