Publication:

NBTI-generated defects in nanoscaled devices: fast characterization methodology and modeling

Date

2017

Journal article

Simple item page Full metadata Statistics

Files

37884.pdf 3.2 MB

Author(s)

;

;

Manut, Azrif B.

;

;

;

Hatta, Sharifah Wan Muhamad

;

Zhang, Wei Dong

;

;

Linten, Dimitri

;

Groeseneken, Guido

Journal

IEEE Transactions on Electron Devices

Statistics

1996 since deposited on 2021-10-24

3last month

Acq. date: 2026-08-22