Publication:

Evaluating probes for "electrical" atomic force microscopy

Date

1999
Proceedings Paper
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Author(s)

Trenkler, Thomas
;
Hantschel, Thomas  
;
Stephenson, Robert
;
De Wolf, Peter
;
Hellemans, L.
;
Vandervorst, Wilfried  
;
Malavé, A.
;
Büchel, D.
;
Oesterschulze, E.
;
Kulisch, W.
;
Niedermann, P.
;
Sulzbach, T.
;
Ohlsson, O.

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Abstract

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1 since deposited on 2021-10-14
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1942 since deposited on 2021-10-14
Acq. date: 2026-05-29

Citations