In depth analysis of post-program VT instability after electrical stress in 3D SONOS memories

Publication:

2016-05

Proceedings Paper

Author(s)

Subirats, Alexandre

;

Arreghini, Antonio

;

Van den Bosch, Geert

;

Degraeve, Robin

;

Linten, Dimitri

;

1860 since deposited on 2021-10-23

Acq. date: 2026-06-01