Publication:

Modeling of the vertical leakage current in AlN/Si heterojunctions for GaN power applications

Date

2020

Journal article

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Author(s)

;

De Santi, Carlo

;

Stoffels, Steve

;

Bakeroot, Benoit

;

;

;

Decoutere, Stefaan

;

Meneghesso,, Gaudenzio

;

Meneghini, Matteo

;

Journal

IEEE Transactions on Electron Devices

Statistics

1975 since deposited on 2021-10-28

Acq. date: 2026-06-03