Publication:
High resolution two-dimensional carrier profiling on sub-100nm silicon nano-devices using scanning spreading resistance microscopy
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1889 since deposited on 2021-10-15
3last month
Acq. date: 2026-05-30
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Statistics
Views
1889 since deposited on 2021-10-15
3last month
Acq. date: 2026-05-30
Citations