Publication:

CDM ESD testing of a 3D TSV stacked IC chip

Date

2014

Meeting abstract

Simple item page Full metadata Statistics

Author(s)

;

Takaya, Satoshi

;

;

Linten, Dimitri

;

;

Chen, Shih-Hung

;

Hasegawa, Keiichi

;

Shintani, Taizo

;

Sawada, Masanori

Statistics

2086 since deposited on 2021-10-22

1last month

Acq. date: 2026-10-13