Publication:

Defect analysis in UTBOX SOI nMOSFETs by low-frequency noise

Date

2012

Proceedings Paper

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Files

24464.pdf 163.3 KB

Author(s)

Luque Rodriguez, A.

;

Cano de Andrade, Gloria

;

Aoulaiche, Marc

;

Mendes Almeida, Luciano

;

;

Jimenez Tejada, J.A.

;

;

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1996 since deposited on 2021-10-20

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Acq. date: 2026-08-18