Publication:

Defect analysis in UTBOX SOI nMOSFETs by low-frequency noise

Date

2012

Proceedings Paper

Simple item page Full metadata Statistics

Files

24464.pdf 163.3 KB

Author(s)

Luque Rodriguez, A.

;

Cano de Andrade, Gloria

;

Aoulaiche, Marc

;

Mendes Almeida, Luciano

;

;

Jimenez Tejada, J.A.

;

;

Statistics

1993 since deposited on 2021-10-20

3last month

Acq. date: 2026-06-03