Publication:
Copper-SiLK* semiconductor dielectric interface: XPS surface analysis and RF plasma treatment of the resin
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1946 since deposited on 2021-10-14
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Acq. date: 2026-08-20
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Views
1946 since deposited on 2021-10-14
1last month
1last week
Acq. date: 2026-08-20
Citations