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Inhomogeneous Charge Carrier Density in Wafer-Scale MoS<sub>2</sub> Caused by Locally Varying Substrate Doping

 
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cris.virtual.orcid0000-0002-5764-2915
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dc.contributor.authorMyja, Henrik
dc.contributor.authorAbdelbaky, Mohamed
dc.contributor.authorUstenko, Sofiia
dc.contributor.authorKumar, Pawan
dc.contributor.authorGroven, Benjamin
dc.contributor.authorMedina Silva, Henry
dc.contributor.authorMorin, Pierre
dc.contributor.authorMertin, Wolfgang
dc.contributor.authorKümmell, Tilmar
dc.contributor.authorBacher, Gerd
dc.contributor.orcidext0000-0002-3216-0901
dc.contributor.orcidext0000-0002-5781-7594
dc.contributor.orcidext0000-0003-1461-5703
dc.contributor.orcidext0000-0001-6792-6033
dc.contributor.orcidext0000-0002-2025-090X
dc.contributor.orcidext0000-0001-8419-2158
dc.contributor.orcidext0000-0002-5244-3167
dc.date.accessioned2026-07-24T10:01:55Z
dc.date.available2026-07-24T10:01:55Z
dc.date.createdwos2026
dc.date.issued2026
dc.description.wosFundingTextWe acknowledge funding by the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation)-IRTG 2803-461605777 and project 414268710.
dc.identifier.doi10.1021/acsami.6c00562
dc.identifier.eissn1944-8252
dc.identifier.issn1944-8244
dc.identifier.issn1944-8252
dc.identifier.pmidMEDLINE:41918249
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/59975
dc.language.isoeng
dc.provenance.editstepusergreet.vanhoof@imec.be
dc.publisherAMER CHEMICAL SOC
dc.relation.ispartofseriesACS Applied Materials & Interfaces
dc.source.beginpage21204
dc.source.endpage21211
dc.source.issue14
dc.source.journalACS APPLIED MATERIALS & INTERFACES
dc.source.numberofpages8
dc.source.volume18
dc.subject.keywordsSURFACE-MORPHOLOGY
dc.subject.keywordsLAYER MOS2
dc.subject.keywordsGROWTH
dc.subject.keywordsFILMS
dc.subject.keywordsPHOTOLUMINESCENCE
dc.subject.keywordsTRANSITION
dc.subject.keywordsTRIONS
dc.title

Inhomogeneous Charge Carrier Density in Wafer-Scale MoS2 Caused by Locally Varying Substrate Doping

dc.typeJournal article
dspace.entity.typePublication
imec.internal.crawledAt2026-04-07
imec.internal.sourcecrawler
imec.internal.wosCreatedAt2026-07-14
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