Publication:
Inhomogeneous Charge Carrier Density in Wafer-Scale MoS<sub>2</sub> Caused by Locally Varying Substrate Doping
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.orcid | 0000-0003-1461-5703 | |
| cris.virtual.orcid | 0000-0002-5764-2915 | |
| cris.virtual.orcid | 0000-0002-5781-7594 | |
| cris.virtual.orcid | 0000-0002-4637-496X | |
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| cris.virtualsource.orcid | 9584d359-66ab-4b5e-9d48-acdcdf7ffbae | |
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| cris.virtualsource.orcid | d95ee44c-582e-4b73-b818-071e11f95438 | |
| dc.contributor.author | Myja, Henrik | |
| dc.contributor.author | Abdelbaky, Mohamed | |
| dc.contributor.author | Ustenko, Sofiia | |
| dc.contributor.author | Kumar, Pawan | |
| dc.contributor.author | Groven, Benjamin | |
| dc.contributor.author | Medina Silva, Henry | |
| dc.contributor.author | Morin, Pierre | |
| dc.contributor.author | Mertin, Wolfgang | |
| dc.contributor.author | Kümmell, Tilmar | |
| dc.contributor.author | Bacher, Gerd | |
| dc.contributor.orcidext | 0000-0002-3216-0901 | |
| dc.contributor.orcidext | 0000-0002-5781-7594 | |
| dc.contributor.orcidext | 0000-0003-1461-5703 | |
| dc.contributor.orcidext | 0000-0001-6792-6033 | |
| dc.contributor.orcidext | 0000-0002-2025-090X | |
| dc.contributor.orcidext | 0000-0001-8419-2158 | |
| dc.contributor.orcidext | 0000-0002-5244-3167 | |
| dc.date.accessioned | 2026-07-24T10:01:55Z | |
| dc.date.available | 2026-07-24T10:01:55Z | |
| dc.date.createdwos | 2026 | |
| dc.date.issued | 2026 | |
| dc.description.wosFundingText | We acknowledge funding by the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation)-IRTG 2803-461605777 and project 414268710. | |
| dc.identifier.doi | 10.1021/acsami.6c00562 | |
| dc.identifier.eissn | 1944-8252 | |
| dc.identifier.issn | 1944-8244 | |
| dc.identifier.issn | 1944-8252 | |
| dc.identifier.pmid | MEDLINE:41918249 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/59975 | |
| dc.language.iso | eng | |
| dc.provenance.editstepuser | greet.vanhoof@imec.be | |
| dc.publisher | AMER CHEMICAL SOC | |
| dc.relation.ispartofseries | ACS Applied Materials & Interfaces | |
| dc.source.beginpage | 21204 | |
| dc.source.endpage | 21211 | |
| dc.source.issue | 14 | |
| dc.source.journal | ACS APPLIED MATERIALS & INTERFACES | |
| dc.source.numberofpages | 8 | |
| dc.source.volume | 18 | |
| dc.subject.keywords | SURFACE-MORPHOLOGY | |
| dc.subject.keywords | LAYER MOS2 | |
| dc.subject.keywords | GROWTH | |
| dc.subject.keywords | FILMS | |
| dc.subject.keywords | PHOTOLUMINESCENCE | |
| dc.subject.keywords | TRANSITION | |
| dc.subject.keywords | TRIONS | |
| dc.title | Inhomogeneous Charge Carrier Density in Wafer-Scale MoS2 Caused by Locally Varying Substrate Doping | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| imec.internal.crawledAt | 2026-04-07 | |
| imec.internal.source | crawler | |
| imec.internal.wosCreatedAt | 2026-07-14 | |
| Files | ||
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