Publication:
ON-state reliability of GaN-on-Si Schottky Barrier Diodes: Si3N4 vs. Al2O3/SiO2 GET dielectric
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1838 since deposited on 2022-03-11
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Acq. date: 2026-08-19
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1838 since deposited on 2022-03-11
2last month
1last week
Acq. date: 2026-08-19
Citations