Publication:

Total-Ionizing-Dose Effects in IGZO Thin-Film Transistors

Date

2023

Journal article

https://doi.org/10.1109/tns.2023.3280432

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Author(s)

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Reed, Robert A.

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Schrimpf, Ronald D.

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Fleetwood, Daniel M.

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Vaisman Chasin, Adrian

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Linten, Dimitri

Journal

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Statistics

937 since deposited on 2024-01-08

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Acq. date: 2026-08-15