Publication:

Bi-modal variability of nFinFET characteristics during hot-carrier stress: a modeling approach

Date

2019
Journal article
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Author(s)

Makarov, Alexander
;
Kaczer, Ben  
;
Vaisman Chasin, Adrian  
;
Vandemaele, Michiel  
;
Grill, Alexander  
;
Hellings, Geert  
;
El-Sayed, Al-Moatasem
;
Grasser, Tibor
;
Linten, Dimitri  
;
Tyaginov, Stanislav  

Journal

IEEE Electron Device Letters

Abstract

Description

Statistics

Views

1993 since deposited on 2021-10-27
Acq. date: 2026-06-03

Citations

Statistics

Views

1993 since deposited on 2021-10-27
Acq. date: 2026-06-03

Citations