Publication:

Bi-modal variability of nFinFET characteristics during hot-carrier stress: a modeling approach

Date

2019
Journal article
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Author(s)

Makarov, Alexander
;
Kaczer, Ben  
;
Vaisman Chasin, Adrian  
;
Vandemaele, Michiel  
;
Grill, Alexander  
;
Hellings, Geert  
;
El-Sayed, Al-Moatasem
;
Grasser, Tibor
;
Linten, Dimitri  
;
Tyaginov, Stanislav  

Journal

IEEE Electron Device Letters

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2005 since deposited on 2021-10-27
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Acq. date: 2026-10-12

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