Publication:
BTI reliability and time-dependent variability of stacked gate-all-around Si nanowire transistors
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2003 since deposited on 2021-10-24
6last month
Acq. date: 2026-08-18
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Statistics
Views
2003 since deposited on 2021-10-24
6last month
Acq. date: 2026-08-18
Citations