Publication:
Beyond interface: the impact of oxide border traps on InGaAs and Ge n-MOSFETs
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1949 since deposited on 2021-10-20
4last month
1last week
Acq. date: 2026-08-15
Citations
Statistics
Views
1949 since deposited on 2021-10-20
4last month
1last week
Acq. date: 2026-08-15
Citations