Publication:
Low-frequency noise behavior of SiO2-HfO2 dual-layer gate dielectric nMOSFETs with different interfacial oxide thickness
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1937 since deposited on 2021-10-15
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Acq. date: 2026-10-13
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Statistics
Views
1937 since deposited on 2021-10-15
2last month
1last week
Acq. date: 2026-10-13
Citations