Publication:
Validation of retention modeling as a trap-profiling technique for SiN-based charge-trapping memories
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1962 since deposited on 2021-10-18
2last month
1last week
Acq. date: 2026-10-13
Citations
Statistics
Views
1962 since deposited on 2021-10-18
2last month
1last week
Acq. date: 2026-10-13
Citations