Publication:
Low-frequency-noise-based oxide trap profiling in replacement high-k/metal-gate pMOSFETs
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1960 since deposited on 2021-10-21
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Acq. date: 2026-10-12
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1960 since deposited on 2021-10-21
2last month
1last week
Acq. date: 2026-10-12
Citations