Publication:

Hot-carrier degradation in FinFETs: modeling, peculiarities, and impact of device topology

Date

2017

Proceedings Paper

Simple item page Full metadata Statistics

Files

37882.pdf 2.07 MB

Author(s)

;

Tyaginov, S. E.

;

;

;

Vaisman Chasin, Adrian

;

;

Hellings, Geert

;

;

Linten, Dimitri

;

Statistics

2007 since deposited on 2021-10-24

1last month

Acq. date: 2026-08-18