Publication:
Comprehensive Investigation of Constant Voltage Stress Time-Dependent Breakdown and Cycle-to-Breakdown Reliability in Y-Doped and Si-Doped HfO2 Metal-Ferroelectric-Metal Memory
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441 since deposited on 2023-08-11
100last month
27last week
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982 since deposited on 2023-08-11
3last month
1last week
Acq. date: 2026-08-19
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