Publication:

Abrupt breakdown in dielectric/metal gate stacks: a potential reliability limitation?

Date

2005

Journal article

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Author(s)

Kauerauf, Thomas

;

Degraeve, Robin

;

Zahid, Mohammed

;

;

;

Roussel, Philippe

;

Groeseneken, Guido

;

;

De Gendt, Stefan

Journal

IEEE Electron Device Letters

Statistics

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Acq. date: 2026-08-16