Capture and emission time map to investigate the positive VTH shift in p-GaN power HEMTs

Modolo, N.; Fregolent, M.; Masin, F.; Benato, A.; Bettini, A.; Buffolo, M.; De Santi, C.; Borga, Matteo; Posthuma, Niels; Bakeroot, Benoit; Decoutere, Stefaan; Vogrig, D.; Neviani, A.; Meneghesso, G.; Zanoni, E.; Meneghini, M.

doi:10.1016/j.microrel.2022.114708

Publication:

Capture and emission time map to investigate the positive VTH shift in p-GaN power HEMTs

Date

2022

Journal article

https://doi.org/10.1016/j.microrel.2022.114708

Simple item page Full metadata Statistics

Author(s)

;

;

;

;

;

;

;

;

;

;

;

;

;

;

;

Journal

MICROELECTRONICS RELIABILITY

Statistics

1331 since deposited on 2023-01-09

7last month

2last week

Acq. date: 2026-08-16

Capture and emission time map to investigate the positive VTH shift in p-GaN power HEMTs

Date

Author(s)

Journal

Abstract

Description

Statistics

Views

Citations

Statistics

Views

Citations