Publication:

Bias Temperature Instability (BTI) in high-mobility channel devices: SiGe, Ge, and InGaAs

Date

2016

Proceedings Paper

Simple item page Full metadata Statistics

Author(s)

;

;

;

;

Arimura, Hiroaki

;

;

;

;

;

;

;

Witters, Liesbeth

;

;

Groeseneken, Guido

;

Collaert, Nadine

;

Linten, Dimitri

Statistics

1986 since deposited on 2021-10-23

Acq. date: 2026-06-01