Publication:

Characterisation of the DARE180U MOSFET Channel Geometry TID Radiation Sensitivity

Date

2022

Proceedings Paper

https://doi.org/10.1109/radecs47380.2019.9745671

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Author(s)

Jansen, R. J. E.

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;

Boatella-Polo, C.

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;

Verhaegen, Shane

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Franciscatto, Giancarlo

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;

Lambrichts, Danny

;

Vargas-Sierra, S.

;

Gonzalez Lujan, J. J.

Journal

na

Statistics

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Acq. date: 2026-10-12