Publication:

CFET SRAM With Double-Sided Interconnect Design and DTCO Benchmark

Date

2023
Journal article
https://doi.org/10.1109/ted.2023.3305322
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Author(s)

Liu, Hsiao-Hsuan
;
Schuddinck, Pieter  
;
Pei, Zhenlin
;
Verschueren, Lynn  
;
Mertens, Hans  
;
Salahuddin, Shairfe Muhammad
;
Hiblot, Gaspard  
;
Xiang, Yang  
;
Chan, Boon Teik
;
Subramanian, Sujith  
;
Weckx, Pieter  
;
Hellings, Geert  
;
Garcia Bardon, Marie  
;
Ryckaert, Julien  
;
Pan, Chenyun
;
Catthoor, Francky  

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

Abstract

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1180 since deposited on 2023-09-19
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Acq. date: 2026-10-13

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