Impact of strain on ESD robustness of FinFET devices

Griffoni, Alessio; Thijs, Steven; Russ, C.; Trémouilles, David; Scholz, Mirko; Linten, Dimitri; Collaert, Nadine; Rooyackers, Rita; Duvvury, C.; Gossner, H.; Meneghesso, G.; Groeseneken, Guido

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Impact of strain on ESD robustness of FinFET devices

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2008

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Impact of strain on ESD robustness of FinFET devices

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